FEI Tecnai G2 F20
The Tecnai G2 F20 is a versatile field emission transmission electron microscope ideally suited for studying a wide range of general and advanced solid state materials. This analytical instrument, which is equipped with a compustage-driven side-entry double-tilt goniometer stage and an assortment of specimen holders, is optimised for imaging at medium resolution or for performing elemental microanalysis.
Electron energy loss spectroscopy (EELS), energy dispersive X-ray (EDX), and high angle annular darkfield (HAADF) signals for elemental microanalysis or spectral imaging can be collected either separately or simultaneously. Diffraction modes include convergent beam diffraction for three-dimensional structure information and micro-diffraction with a minimum probe size of 4 nm.
For these purposes, the instrument is equipped with an EDAX r-TEM SUTW detector and a Gatan Tridiem 863P spectrometer coupled to integrated computer systems running analytical software. This system can acquire and quantify EDX and EELS spectra to generate elemental maps and perform microstructural imaging.
External users planning to use this instrument should consult Marc Heggen or Michael Feuerbacher.
Users of the Tecnai G2 F20 are kindly asked to quote a tecnical description of the instrument published in the Journal of large-scale research facilities 2 (2016) A77. http://dx.doi.org/10.17815/jlsrf-2-138 when referring to the use of this instrument in publications.
Instructions
Knowledge
- Screen current calibration
- Please use the microscope carefully, report malfunctions, and please pay special attention to the sample holders!
- If you use the single-tilt holder, always use the dedicated tool to open/close the specimen lid. Do not use any other tools (in particular tweezer pins), as they will damage the holder!
- Please note that the energy filter is working, but its functionality is restricted to spectrum operation mode, so EFTEM is not possible. Do not switch the system into EFTEM mode, since it uploads a wrong alignment of the filter and makes spectrum mode misaligned (zero loss peak drifts). In case this happens to you, restart the filter control software (and continue working in spectrum mode) to recall the correct alignment.
- Please mind the step at the entrance.
Nanomegas ASTAR System
If you like to use the Nanomegas system, please contact Marc Heggen or Marta Lipińska-Chwałek. User guides are here:
File:ASTAR DiffGen.pdf
File:ASTAR Index.pdf
File:ASTAR MapViewer.pdf
File:ASTARv1 GettingStarted DataProcessing.pdf