Keyan Ji

A member of PGI-5 Institute for Microstructure Research.

Research

I became a member of Scanning tunneling microscopy and spectroscopy group on 23/11/2020, my research is dedicated to following projects:

   Quantitative measurement of electrostatic potentials at semiconductor interfaces by combined electron holography and scanning probe microscopy.

Expertise

   Stroboscopic imaging technique with Ultra-fast SEM (USEM).
   Quantitative measurement of photo-excited charge dynamics on doped silicon (111) surface with USEM.
   Sample preparation for USEM.
   Optical alignment for laser.
   Programming with Matlab, C.
   CAD with Solidworks.

Contact

Email: K.ji@fz-juelich.de

Phone: +49 2461 61 4693

Location: Building 04.6, room 97a